IEC IEC62899-202-11 Edition1.02025-04 INTERNATIONAL STANDARD Printed electronics Part202-11:Materials-Conductiveink=Measurementmethodof electrical resistanceuniformityforlargeareaprinted conductive layer IEC 62899-202-11:2025-04(en) THISPUBLICATIONISCOPYRIGHTPROTECTED Copyright@2025IEC,Geneva,Switzerland or by any means,electronic or mechanical, including photocopying and microfilm,without permission in writing from copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. IEC Secretariat Tel.: +4122 919 02 11 3, rue deVarembe [email protected] CH-1211Geneva20 www.iec.ch Switzerland About the IEC International Standards for all electrical, electronic and related technologies. AboutIEcpublications The technical content of IEC publications is kept under constant review by the IEC.Please make sure that you have the latest edition, a corrigendum or an amendment might have been published. IEC publications search-webstore.iec.ch/advsearchform IEC Products & Services Portal-products.iec.ch The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the varietyofcriteria(reference number,text, technical publications previews, graphical symbols and the glossary. committee, ...). It also gives information on projects,replaced With a subscription you will always have access to up to date and withdrawn publications. content tailored to your needs. IEC Just Published-webstore.iec.ch/justpublished Electropedia-www.electropedia.org Stay up to date on all new IEC publications. Just Published The world's leading online dictionary on electrotechnology, detailsallnewpublicationsreleased.Availableonlineandonce containing more than 22 500 terminological entries in English a month by email. and French, with equivalent terms in 25 additional languages. Also known as the International Electrotechnical Vocabulary IEC Customer Service Centre-webstore.iec.ch/csc (IEV) online. If you wish to give us your feedback on this publication or need further assistance,please contact the Customer Service Centre:[email protected]. IEC IEC62899-202-11 Edition 1.02025-04 INTERNATIONAL STANDARD Printedelectronics Part202-11:Materials-Conductiveink-Measurementmethodof electrical resistanceuniformityforlargeareaprintedconductivelayer INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.180; 87.080 ISBN 978-2-8327-0355-7 Warning!Make sure that you obtained this publication from an authorized distributor. Registered trademark of the International Electrotechnical Commission IEC62899-202-11:2025IEC2025 CONTENTS FOREWORD 3 INTRODUCTION. 5 1 Scope.. 6 2 Normativereferences. 6 3 Terms and definitions.. 4 Standardenvironmentalconditions. 5 General 6 Apparent electricalresistancetomographymethod. 6.1 Test sample.... 6.2 Measurementmethodology. 6.3 Testprocedure. 9 6.4 Measurement.. 10 6.5 Data analysis. 10 6.5.1 Reportingelectrical resistance.. 10 6.5.2 Reportof results 10 Electrical potential tomography method.. 11 7.1 Testsample 7.2 Measurementmethodology 7.3 Test procedure.. 7.4 Data analysis ... 12 7.4.1 Reporting electrical potentialtomography 12 7.4.2 Reportof results 12 Bibliography.. 13 Figure1-Schematic diagramshowingresistancemeasurementofa largeareaprinted layer. .8 Figure 2-Measurementmethodologyforalarge areaprinted layer.. Figure3-Exampleoftheelectricalresistancetomographyresults. 10 Figure 4-Measuringpoints andclearances to sample in electricalpotential tomography method... 11 Figure5-Exampleoftheelectricalpotentialtomographyresults 12 Table 1-List of dimensions of samples. - 3 IEC62899-202-11:2025IEC2025 INTERNATIONALE ELECTROTECHNICAL COMMISSION PRINTEDELECTRONICS Part202-11:Materials- Conductiveink-Measurementmethodof FOREWORD 1 all nationalelectrotechnical committees (IEC National Committees).Theobjectof IEC istopromote international inadditiontootheractivities,IECpublishesInternational Standa